Universal Pattern Set for Arithmetic Circuits
نویسندگان
چکیده
منابع مشابه
Universal Pattern Set for Arithmetic Circuits
The exponential increase in test cost is one of the new challenges being posed by technology scaling. This Paper has been aimed to deal with the issue of testing cost which adds to the chip cost. Here we propose a new pattern set for testing the arithmetic circuits which contains a minimum number of test vectors and easy to generate on the chip and hence supports at-speed testing of the circuit...
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ژورنال
عنوان ژورنال: International Journal of Computer Applications
سال: 2012
ISSN: 0975-8887
DOI: 10.5120/5060-7390